AFM imaging of large areas gets faster

Baltfab researchers have developed an atomic force microscopy (AFM) scanning technique which enables AFM imaging of large areas at unprecedented (up to 45 mm/s)  scanning speed. More information and the link to the paper can be found here: (http://nanotechweb.org/cws/article/lab/68003)

Super_Fast_AFM

Martynas Gavutis
customer@baltfab.com
+370 526 616 43

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